Keithley New Instrumentation Devices for Semiconductor Analysis

Keithley’s Models 2635 and Model 2636 is company’s new new instrumentation devices for semiconductor parametric analysis. The new products represent a new and unique way of doing parametric analysis at resolutions as fine as 1fa (10-15 amp), which is often required for many optoelectronic, nanotechnology and semiconductor devices…

The Models 2635 and 2636 provide cost-effective DC and pulse testing from femtoamps and microvolts up to 200V/1.5A. They operate with or without a PC, providing test speeds up to four times faster than typical mainframe-based source-measure solutions. Moreover, each includes a PC-like microprocessor to enable easy programming and independent execution of test programs (scripts) ranging from the simple to complex, including sourcing, measuring, test sequence flow control, and decisions with conditional program branching…

The Models 2635 and 2636 enable users to significantly reduce their cost of test for low and medium pin count devices or multiple devices and material samples. They operate as five precision instruments in a single box: SMU (source-measure unit), DMM (digital multimeter), bias source, low frequency pulse generator, and arbitrary waveform generator…

In addition to TSP, Keithley's TSP-Link master/slave connection provides a high-speed, low-latency interface to other TSP-based instruments, enabling simple multi-box and multi-instrument software control. A major benefit is easy scalability of Series 2600 test systems according to present and future needs. Multiple single-channel (Model 2635) units and dual-channel (Model 2636) units can be integrated seamlessly without a host mainframe…

All of Keithley's TSP-based systems are capable of storing and running thousands of lines of code for predefined device tests that include limit comparisons, pass/fail decisions, parts binning, etc., and they all work with or without a PC controller during test execution…

More info: Keithley Instrumentation Devices for Semiconductor Parametric Analysis